Detailed Product Description

Type EDX3600

1. Technical Performance and Specifications

1.1 The elements can be analyzed from the sodium (Na) to uranium (U).

1.2 Analysis range of the content of elements is from 1ppm to 99.9%.

1.3 Testing time: 60-200s.

1.4 The measurement repeatability can reach 0.1% of total intensity of fluorescence when the content is above 96%.

1.5 Energy resolution: 155±5eV (Ordinary).

1.6 Temperature range is from 15 to 30.

1.7 Power supply: AC 220±5V.

(The purified AC regulated power supply is recommended.)

1.8. Independent matrix effect correction model.

1.9. Multi-variable non-linear regression procedure.

1.10 Arbitrary optional analysis and identification models.

1.11. 24 elements can be analyzed simultaneously.

2. Main Hardware Configuration of EDX 3600

2.1 Silicon Pin Semiconductor Detector and Amplifier Circuit.

2.2 X-Ray Tube

2.3 High/Low Voltage Power Supply

2.4 Multi-Channel Pulse Amplitude Analyzer

2.5 High Resolution Camera

2.6 Real-Time Parameter Feedback and Display System

3. Peripherals of EDX 3600

3.1 Computer

3.2 Color Ink-Jet Printer

3.3 Regulated Power Supply (Optional,requiring additional charges)

3.4 Vacuum Pump

4. Software Configuration of EDX 3600

4.1 Full Element Analysis Software

4.2 Plating Thickness Analysis Software (Optional, requiring additional charges)